Electron microscopy is used in materials science and quality control and offers the possibility to examine different samples with a very high depth of field and high magnifications. Resolutions down to the nm range can be achieved.

Through energy dispersive X-ray analysis, qualitative and quantitative analysis can be performed on the sample. The results are presented in spectra, element distributions and spatially resolved mapping images.

The samples must be conductive and vacuum-stable, as the analysis is carried out in a high vacuum. Non-conductive samples (e.g. organic samples) can be made conductive by coating them with a thin layer of gold.

Use scenarios:
-Material science investigations and material analysis e.g. on fractured surfaces or materials.
-Quality control in manufacturing
-Material analysis of samples

Equipment list:
-Scanning electron microscope Phillips XL30
-Bruker Quantax EDX system with XFlash detector
-Quorum Q150Tplus high vacuum sputter coater

-Image acquisition and analysis software for electron microscopy.
-Esprit 2 analytical software for X-ray analysis