Reliable microelectronic systems must undergo extensive and costly qualification testing prior to their product release. Researchers from Jade University of Applied Sciences, along with other leading companies, research institutes and universities, are working to make these tests significantly faster, more flexible and more cost-effective through new simulation approaches.
The MikroVAL project – Research into digitally supported reliability qualification in microelectronics – was launched in spring 2024 with a coordination meeting of the project partners. It runs from 1 February 2024 to January 2028 and is funded with €1.88 million by the Federal Ministry of Education and Research. The industry partners HELLA, Robert Bosch GmbH, Siemens AG, BMW AG and Budatec GmbH are contributing a further €420,000. Also involved in the project are Fraunhofer IZM, Fraunhofer IKTS, Dresden University of Technology, Berlin University of Technology and Jade University of Applied Sciences.