Publikationsdetails
| Autoren | M.Sc. Siyang Hu, Sofiane Bouhedma, M.Eng. Arwed Schütz, Simon Stindt, Prof. Dr.-Ing. Dennis Hohlfeld, Prof. Dr.-Ing. Tamara Bechtold |
| Publikationsjahr | 2021 |
| Erschienen in | Microelectronics reliability |
| DOI |
| Autoren | M.Sc. Siyang Hu, Sofiane Bouhedma, M.Eng. Arwed Schütz, Simon Stindt, Prof. Dr.-Ing. Dennis Hohlfeld, Prof. Dr.-Ing. Tamara Bechtold |
| Publikationsjahr | 2021 |
| Erschienen in | Microelectronics reliability |
| DOI |